XRF: X-ray Fluorescence Analysis
X-Ray Fluorescence (XRF) analysis is a useful technique in nanomaterials characterization.
This technique is basically used to analyze the film thickness and elemental composition (qualitative & quantitative)
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Qualitative analysis:
It means that the XRF analysis reveals the elements that exist in the sample, such as Pb, Fe, Co, Cu, Ag, etc.
Quantitative analysis:
It means that the XRF analysis reveals the existing elements in terms of atom% or wt%.
XRF is a non-destructive technique
A non-destructive technique means that the sample can be analyzed again and again. Such techniques don’t destroy the sample.
As the XRF working principle is based on the emission of light so let's first discuss the fluorescence.
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Fluorescence:
It is basically the emission of light (in this case, X-rays) by a substance that has absorbed X-rays. In most cases, the emitted light has a longer wavelength than the absorbed radiation.
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Working Principle of XRF:
When atoms in a sample are bombarded with X-rays, inner- shell electrons knocked out, and immediately, the electrons from outer shells drop down to fill the vacant position of the atoms. As a result, energy is produced, some of which are in the form of X-rays. Each element has its own unique X-ray characteristics, so the emitted X-rays from a sample can provide qualitative and quantitative compositional information about the sample.