Atrenta's Yuan Lu talks with Semiconductor Engineering about code coverage, functional coverage and the use of assertions in debugging designs.
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Why Connectivity Is Changing Microcontrollers
Making Electronics More Efficient
Software-Defined Vehicles
Changes In Formal Verification
Making Adaptive Test Work Better
MCU Changes At The Edge
Adapting To Evolving IC Requirements
Sensor Fusion Challenges In Automotive
Overlay Optimization In Advanced IC Substrates
Challenges In RISC-V Verification
Cache Coherency In Heterogeneous Systems
Rethinking Chip Economics
Cost And Quality Of Chiplets
Integration Challenges For RISC-V Designs
Yield Tracking In RDL
How To Stop Row Hammer Attacks
What's Changing In DRAM
Reducing Power In Data Centers
Using Deep Data For Improved Reliability Testing
Improving AI Productivity With AI
What To Do About Electrostatic Discharge In Chips
Total Overlay With Multiple RDLs
Coding and Debugging RISC-V