Xray Diffraction (XRD) Analysis
Xrays diffraction (XRD) is a common and key characterization technique in nanotechnology and other diverse research fields.
XRD pattern is plotted between the x-rays intensity (y axis) and 2 theta (angle at x-axis).
The XRD pattern reveals a lot of information, BUT FIVE of them are very important
1. FWHM- Full width at half maxima
2. Peak width
3. Peak intensity
4. Theta value (Peak positions)
5. Peak shift