As material scientists, we are often asked about the differences between particle size obtained using microscopic techniques such as SEM and crystallite size from XRD.
Microscopic techniques provide high-resolution images of the surface of a material and can be used to measure the size, shape, and distribution of individual particles. However, these techniques only provide information about the external morphology of the particles and do not give any information about their internal structure.
On the other hand, X-ray diffraction (XRD) is a technique that provides information about the internal structure of a material. By analyzing the diffraction patterns of X-rays that have been scattered by the atoms in a crystal lattice, it is possible to determine the size of the crystallites that make up the material. This information is particularly useful for materials that are composed of crystalline phases, such as metals and ceramics.
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