Nano Technology Session 2 (SEM, TEM, AFM, Applications of Nanotechnology)

Опубликовано: 01 Октябрь 2024
на канале: Engineering Physics by Sanjiv
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This is a 2nd session on NanoTechnology. In this session, Tools for characterization of Nanoparticles: Scanning Electron
Microscope (SEM), Transmission Electron Microscope (TEM), Atomic Force Microscope (AFM) are introduced. Applications of
nanotechnology are discussed at the end. Flow of discussion is as per First year Engineering Mumbai University syllabus

Link for the notes : https://drive.google.com/file/d/1Dm9E...

for Engineering Physics. This session was created by considering the current scenario of lock down due to which we are not

able to go the colleges. Hope that students will find it useful..

References used :
1. Advances In Nano Materials And Applications: History of Nanotechnology From PreHistoric to Modern Times - Madhuri

Sharon
2. Nano: The essentials, understanding Nanoscience and Nanotechnology - T. Pradeep