How to Prevent ESD and EOS Damaging Measuring Instruments and DUT
ESD(Electric Static Discharge) 및 EOS(Electric Over Stress)는 DUT 및 측정 기기의 반도체를 손상시킬 수 있습니다. 이 비디오는 DUT 및 측정 기기의 ESD/EOS 손상을 방지하는 데 필요한 단계를 제공합니다.
Electric Static Discharge (ESD) and Electric Over Stress (EOS) can damage the semiconductors in your DUT and measuring instruments. This video will provide you with the necessary steps to prevent ESD/EOS damage to your DUT and measuring instrument.
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