DELTA Microelectronics – Integrated circuit failure analysis
DELTA Microelectronics operates its own in-house microelectronics failure analysis lab. Here we can identify the root cause of failed integrated circuits, modules or subassemblies with equipment like our SAM (Scanning Acoustic Microscopy), SEM (Scanning Electron Microscopy) and high-resolution x-ray. This analysis capability ensures that we are able to quickly get to the root cause of any problem.
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