Ossila Four Point Probe System - Measure the Conductivity & Resistance of Thin Nano-Material Layers
Ossila's Four-Point Probe System is an easy-to-use tool for the rapid measurement of sheet resistance, resistivity, and conductivity of materials.
Applications
1. Material Characterisation
2. Thin-Film Solar Cells and LEDs
For more information & advise
KGC Resources Sdn. Bhd.
Tel: 03-3341-2880 / +6221-2252-2110
Mob: 014 964 9880
Email: [email protected] / [email protected]
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