VLSI testing, National Taiwan University
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7 9 Combinational ATPG, FAN open source code(*optional)
18 6 Advanced Topics: Power-aware ATPG
18 5 Advanced Topics: timing-aware ATPG
18 4 Advanced Topics: N-detect, cell-aware tests
18 3 Advanced Topics: IDDQ testing
18 2 Advanced Topics: Defect-based testing, Very Low Voltage testing
18 1 Advanced Topics: Defects
17 2 FunctionTest CheckExp (revised June, 2021)
2 4 LogicSim EventDriven (new version 2021)
8 5 Sequential ATPG Conclusion (*optional)
8 4 Sequential ATPG Simulation (*optional)
8 3 Sequential ATPG: Backward Time Frame Processing (*optional)
10 4 Diagnosis EffectCause (*optional)
15 3 Test Compress Hardware Stimulus (updated 5/10/2020)
5 5 FaultSim DiffFsim(*optional)
10 5 Diagnosis, Chain Diagnosis (*optional)
16 3 MemTest March
16 2 Memory Test - Classical algorithms
16 1 MemTest Intro
4 2 Dominance Fault Collapsing, DFC (*optional)
11 2 DFT1 ScanConcepts
13 2 BIST1 LFSR
13 5 BIST1 CA
9 3 DelayTest PathTG