XRF Plating Measurement Systems - Precisely Measure and Analyze Plating Thickness. Bowman XRF.

Опубликовано: 11 Октябрь 2024
на канале: Bowman XRF
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Bowman's P and M Series XRF instruments provide thickness measurement, elemental analysis, plating solution analysis. Quickly measure up to 5 coating layers simultaneously, including alloys and ultra-thin films. ASTM B-568.

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