Textured and untextured BiMnO3/Si (001) thin film
Synthesis and growth characterization of RF magnetron sputtered BiMnO3 on Si (001) substrates.
Characterization of the crystal structure of the films by X-ray diffraction (XRD) in grazing incidence and Bragg-Brentano geometry.
Proposed a Gaussian-shaped inverse pole figure, with two modulating factors, namely: inverse pole figure and direct pole figure to analyze in detail the texture orientation of BiMnO3 thin film.
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