VIEW Micro-Metrology High Performance Video Measuring System
Non-contact optical metrology systems
VIEW Micro-Metrology produces high accuracy video coordinate measuring systems for process control metrology.
VIEW Micro-Metrology is the combination of Micro-Metric and VIEW Engineering, two technology-leading companies each with over 30 years of experience designing and building the world's best non-contact optical metrology systems that have joined together under Quality Vision International, the world's largest vision metrology company.
We offer two families of high-precision systems: our high-speed, high accuracy coordinate metrology systems from VIEW Engineering measure complex components, and our microscopy systems from Micro-Metric measure semiconductor and MEMs wafers, hard disk head sliders and photomasks.
All VIEW Micro-Metrology systems use our exclusive Dual Magnification Optics System to provide accurate images under a wide variety of lighting conditions.
The Dual magnification optics system provides two internal magnification multipliers - "Low" magnification is a 1X multiple of the front lens, while "High" magnification is a 4X multiple. Both magnification images are always present; selecting one camera or the other determines the magnification image that is used for measurement. The choice of low or high magnification is instantaneous and requires no movement of any optical element so there is no change in calibration or datum references. This makes for a highly accurate and repeatable system.
The dual magnification optics system also provides a direct through-the-lens surface light, an optional Ronchi Grid pattern projection for increased focus resolution, and provisions for a through-the-lens laser for precise height and contour measurements.
All VIEW Micro-Metrology systems are equipped with high brightness LED illuminators. Back-light and through-the-lens surface light are standard on all machines. During programming and automatic measurements, the light source and intensity for each measurement may be programmed to best illuminate the feature of interest.
For surface features that are at an angle with respect to the X-Y plane, VIEW Micro-Metrology's Programmable Ring Light (PRL) may be used. In addition to programmable intensity, the PRL offers three unique degrees of freedom in lighting the scene:
The direction of the illumination may be selected.
The angle of incidence of the light may be selected.
The color of the illumination may be selected
3D Surface Measurement
AMF™ is an advanced video analysis technique that uses the data collected from a normal video auto-focus step and turns it into a 3D image of a feature. In addition to 3D information, it provides height or depth measurement of multiple features of a single image. This technique can be used to measure flatness, roughness, height, and volume. It is faster than any scanning method requiring XY stage motion.
This is yet another example of VIEW Micro-Metrology's commitment to advancing technology for video metrology applications.
CiC™ measurement takes "snapshots" of a part image as the part is continually moved beneath the system optics. VIEW Micro-Metrology's exclusive CiC technique can map a large surface area, stitching together individual images so they can be analyzed as a whole. Depending on the part geometry being measured, cycle time is reduced significantly without compromising measurement performance.